-Instrument Introduction

The research and application of various thin films in many disciplines of modern science and technology are becoming increasingly widespread, therefore, measuring the thickness and optical parameters of thin films has become more urgent and important. In practical work, ellipsometry is often used for measurement. This method has high sensitivity and accuracy in measurement, and is a non-destructive measurement. He can simultaneously measure the thickness and refractive index of thin films.

This product is a manually adjustable instrument that measures the thickness and optical parameters of thin films. It clearly demonstrates the structural functions and adjustment methods of each component of the ellipsoidal thickness gauge, allowing users to have a detailed understanding of the principle and structure of the ellipsometer and cultivate their hands-on operation ability.